News

Category: General
Jul 21, 2017

JPK AFM User Training Course September 14th-15th 2017


All JPK users are warmly invited to attend the hands-on training course at the JPK Training Center in Berlin (Germany) from September 14th to 15th 2017.


Scope of the Course

The course focuses on the principles of imaging and force spectroscopy applications at the interface of biology, physics and material sciences in combination with simultaneous optical microscopy. JPK offers all JPK users the opportunity tupdate their skills and tlearn about additional modes within the JPK AFM product family.

The topics covered include:

- AFM imaging

  • Easy and robust image acquisition
  • Imaging in different modes: Contact, AC and Quantitative Imaging
  • Imaging in different environments: Air, Liquid, Temperature controlled environment
  • Fast AFM: Imaging at higher temporal resolution
  • Electrical AFM modes

- Force Spectroscopy

  • Cell mechanics
  • Force Spectroscopy & data analysis

- Combining high performance optics and AFM

  • Combination of transmitted light microscopy (bright-field, phase-contrast, DIC) with AFM
  • Combining super resolution microscopy techniques (STED) with AFM
  • Software integration of optical and AFM imaging with DirectOverlay™

More Info

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