Nanotechnology & Surface Metrology

Image Metrology

Image Metrology - Nanotechnology

Image Metrology was founded in 1998 and one of the leaders of image processing software for "nano-microscopy".


Image Metrology - Nano Micrscopy software


SPIP™ Software - The Scanning Probe Image Processor

Leading research institutes and high-tech companies in more than 42 countries including Australia use SPIP™ for image processing applications within semiconductor inspection, physics, material science, chemistry, biology, metrology, and nano technology.
SPIP™ supports a variety of microscope types and their file formats including Scanning Probe Microscopes (SPM), interference microscopes, Scanning Electron Microscopes (SEM), confocal microscopes, optical microscopes, and profilers. Whether you are an expert user or new to the field of image processing, SPIP™ lets you produce the results you need with just a few mouse clicks.
SPIP™ is a modular software package offered as a basic module and 13 optional add-on modules. The Basic Module includes essential features such as file reading, profiling, and plane correction. The add-on modules are dedicated to specific purposes within calibration, noise reduction, analysis, and 3D visualization. On the following pages you will find a description of each module and learn how you can improve the efficiency and quality of your work.

  • Scanning Probe Microscopes (SPM)
  • Scanning Electron Microscopes (SEM)
  • Transmission Electron Microscopes (TEM)
  • Interferometers
  • Confocal Microscopes
  • Profilers

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Particle & Pore Analysis

Roughness Analysis in SPIP

Image Filtering in SPIP

Tip Characterization in SPIP

Automation in SPIP

3D Rendering in SPIP

Correlation Averaging in SPIP

Extended Fourier Analysis in SPIP

Stitching Cross Sections in SPIP